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process-window

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Physics-accurate EUV lithography simulator — LPP Sn-plasma source, CXRO materials, multilayer TMM optics, RCWA 1D/2D mask3D, Abbe/Hopkins aerial imaging with partial coherence, resist chain (Dill ABC, PEB, development, shot noise), process window (Bossung, DoF/EL), resist calibration from wafer data. Apache-2.0, 534 tests, 6 verified notebooks.

  • Updated Aug 17, 2026
  • Jupyter Notebook

The project implements state-of-the-art computational lithography algorithms used in semiconductor manufacturing, complete with educational documentation and working examples!

  • Updated Feb 5, 2026
  • Python

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